In semiconductor manufacturing, especially in electrical test data, but also in other parameters, there are often sets of parameters that are very highly correlated. Even a change in the correlation ...

1. Aspects of multivariate analysis -- 2. Matrix algebra and random vectors -- 3. Sample geometry and random sampling -- 4. The multivariate normal distribution -- 5. Inferences about a mean vector -- ...

Understanding how structural defects affect the optoelectronic performance of silicon semiconductor wafers is critical for improving device efficiency and reliability. Simultaneous Raman and ...

We adapt a semi-Bayesian hierarchical modeling framework to jointly characterize the space–time variability of seasonal precipitation totals and precipitation extremes across the Northern Great Plains ...