The vulnerability of PERC modules to LID and LeTID is well known and among the reasons the industry is moving towards N-type technology, which tends to be less affected by the two phenomena. TUV Nord ...

Ever since the earliest semiconductor devices, silicon health has been a concern. Systems manufacturers wanted to be sure that their chips worked properly before being soldered onto printed circuit ...

Joining a family of RF reliability test systems is the HiPR-AARTS (High Power RF Automated Accelerated Reliability Test System) from Accel-RF, intended to help manufacturers prove the reliability of ...

The transition to the 2nm technology node introduces unprecedented challenges in Automated Test Equipment (ATE) bring-up and manufacturability. As semiconductor devices scale down, the complexity of ...

STAr Technologies, a provider of semiconductor test solutions, releases a new Sagittarius-WLR integrated platform for advanced Wafer-Level Reliability (WLR) tests. Sagittarius-WLR is developed to ...