Scan Software Squashes Circuit Test Time Reduced test data volume, test run time, and automatic test equipment (ATE) reloads come via VirtualScan software, which ultimately slashes the cost of ...

SAN JOSE, Calif., Oct 19, 2005-- SynTest Technologies, Inc., a leading supplier of Design-for-Test (DFT) tools, was granted 33 claims on Oct. 11, 2005 under United States Patent # 6,954,887 for its ...

For decades, process and design scaling has triggered the adoption of transformative test solutions. About twenty years ago, when at-speed test became a de-facto requirement, on-chip compression ...

Anyone involved in IC product sign-off that includes a mixed signal design portion knows that developing robust tests for these intricate designs has historically been a significant bottleneck, no ...

Conducting product testing on printed circuit boards (PCBs) has the potential to become costly. Because of this, it’s easy for businesses to view PCB assembly testing as an expense without much value.

For example, scan tests tend to run circuits in nonstandard modes, and scan shifting causes maximum power dissipation for short periods. Such high power dissipation during production test can stress ...

Boundary Scan: What Is It? Boundary scan test techniques were first discussed in the late 1980s. At the time, experts believed that the growing complexity of chips would have a serious effect on an ...