Researchers have designed a robust image-based anomaly detection (AD) framework with illumination enhancement and noise suppression features that can enhance the detection of subtle defects in ...

Why it matters: Proper coating inspection protects tanks from corrosion, extends service life, and avoids expensive shutdowns or environmental hazards. What’s involved: Inspections cover surface ...

Modern advanced packaging processes and shrinking semiconductor device sizes mean that it is vital to consistently eliminate sub-20 nm defects and surface contaminants. To do this effectively, the ...

A new wafer inspection platform combines AI analytics, sub-micron imaging, SWIR sensing, and precision metrology to help ...

Test Research, Inc. has introduced the TR7950Q SII Series, an AI-powered wafer inspection and metrology platform designed for advanced packaging and back-end semiconductor processes. The system offers ...

The main objective of this project is to let students apply the image processing techniques that been taught in class in a given conditions based on their title. This particular project involved the ...