Researchers have developed a physics-based technique that accurately measures atomic-scale semiconductor defects, helping ...
A new research review looks at how computer vision and machine learning could be used to spot defects in 3D printed concrete.
Researchers have published research detailing their development of an AI framework to detect defects in additively ...
The team developed an off-axis bright- and dark-field OCT system with a custom-designed high-precision objective lens. By ...
Detecting macro-defects early in the wafer processing flow is vital for yield and process improvement, and it is driving innovations in both inspection techniques and wafer test map analysis. At the ...
Whether the discussion is about smart manufacturing or digital transformation, one of the biggest conversations in the semiconductor industry today centers on the tremendous amount of data fabs ...
The Department of Science and Technology (DOST) has unveiled new equipment capable of analyzing materials and detecting defects at the nanoscale, aimed at helping companies improve product quality and ...
Scientists from China have developed a new deep-learning method for detecting defects in PV cells. Analyzing electroluminescence (EL) images, the novel system utilizes the YOLOv8 convolutional neural ...
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